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Title:一种超高分辨率相位差测量的方法及系统

Institution:机电工程学院

Scope of Patent:国内

First Author:董绍锋

Type of Patent:Invent

Application Number:CN201310066563.6

Authorization Number:CN201310066563.6

Number of Inventors:9

Service Invention or Not:No

Application Date:2013-03-02

Authorization Date:2015-03-18

Date:2024-06-12